Table Of Contents
Cisco ONS 15454 SDH TL1 Test Access
Intrusive and Non-Intrusive Modes
Quick Start Guide
Cisco ONS 15454 SDH TL1 Test Access
1 Test Access
The test access (TACC) feature allows a third-party Broadband Remote Test Unit (BRTU) to create non-intrusive test access points (TAPs) to monitor the circuits on the ONS 15454 SDH for errors. The test access feature also allows the circuit to be split (intrusive), so that the transmission paths can be tested for bit errors via the use of various bit test patterns. The two BRTUs supported by the ONS 15454 SDH are the Hekimian/Spirent BRTU-93 (6750) and the TTC/Acterna Centest 650.
The test access functionality provides TL1 commands for creating and deleting TAPs, connecting or disconnecting TAPs to circuit cross-connects and changing the mode of test access on the ONS 15454 SDH. You can view test access information in CTC; in node view click the Maintenance > Test Access tabs.
A TAP provides the capability to connect the circuit under test to a BRTU. This connection initially provides in-service monitoring capability to permit the tester to determine that the circuit under test is idle. The monitor connection should not disturb the circuit under test. The access point and remote test unit (RTU) also provide the capability of splitting a circuit under test. A split consists of breaking the transmission path of the circuit under test. This is done out of service. The two sides of the access point are called the Equipment (E) and Facility (F) directions. For a 4-wire or 6-wire circuit, the transmission pairs within the access point are defined as the A and B pairs. The circuit under test should be wired into the access point so the direction of transmission on the A pair is from E to F, and the transmission direction for the B pair is from F to E (Figure 1).
Figure 1 Circuit with no access (dual FAD TAP)
A dual FAD (facility access digroup) TAP uses twice the bandwidth of the circuit under test. This can be specified by the TAPTYPE parameter as shown in ED-<MOD2> command syntax in the "ED-<rr>" section. The values are SINGLE/DUAL. It defaults to DUAL.
A single FAD TAP uses half the bandwidth as that of the dual FAD i.e., it will use the same bandwidth as the circuit accessed for the TAP creation. This can be specified by the TAPTYPE parameter as shown in the "ED-<rr>" section. The values are SINGLE/DUAL. The MONEF, SPLTEF, LOOPEF modes are not supported by Single FAD TAPs (Figure 2).
Figure 2 Circuit with no access (single FAD TAP)
2 TL1 Interface Commands
TL1 supports commands to create, delete, connect, change, retrieve, and disconnect TAPs.
TAP Creation/Deletion
ED-<rr>
The edit command (ED-<rr>) is used to change an existing Port/VC to a TAP.
ED- (E1, E3, DS3I, VC12, VC3, VC4, VC42C, VC43C, VC44C, VC48C, VC416C, VC464C):[<TID>]:<AID>:<CTAG>[:::TACC=<TACC>],[TAPTYPE=<TAPTYPE>];
Edit an existing Port/ VC and change it to a TAP so it can be used when requesting TACC connections. This includes an optional parameter TACC=n that defines the port/VC as a test access point with a selected unique TAP number. This TAP number will be used when requesting test access connections to circuit cross-connects under test. The TAP creation will fail if the port/VCn already has a cross-connect on it.
The TAPTYPE parameter's values are SINGLE/DUAL. The MONEF, SPLTEF, LOOPEF modes are not supported by single FAD TAPs. It defaults to DUAL.
Note
This command generates a REPT DBCHG message.
Note
Note
The following apply to TAP numbers:
1.
2.
3.
ED-E1
When an ED-E1 is executed with a specified TACC value for a given E1 port/facility, a DFAD (dual facility access digroup) is created by using the specified port/facility and the consecutive port/facility. The command in Example 1 creates a DFAD on FAC-1-1 and FAC-1-2.
Example 1 ED-E1::FAC-1-1:12:::TACC=1;
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Note
ED-E3
When an ED-E3 is executed with a specified TACC value for a given E3 port/facility, a DFAD is created by using the specified port/facility and the consecutive port/facility. The command in Example 2 creates an E3 DFAD on FAC-2-1 and FAC-2-2.
Example 2 ED-E3:: FAC-2-1:12:::TACC=2;
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Note
ED-DS3I
The ED-DS3I command is used for DS3 access on a DS3I card. When an ED-DS3I is executed with a specified TACC value for a given DS3I, a DFAD is created by using the specified facility and the consecutive port/facility. The command in Example 3 creates DFAD on FAC-16-1 and FAC-16-1.
Example 3 ED-DS3I::FAC-16-1:12:::TACC=3;
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Note
ED-VC4n
When an ED-VC4n is executed for a TACC it assigns the VC path for the first 2 -way test access connection and VC+1 as the 2nd 2-way connection. Similarly, for VC42c, VC43c, VC44c, VC48c, VC416c next consecutive VC of same width is chosen. The TAP creation will fail if either of the consecutive VC's are not available. The command in Example 4 creates a TAP on VC4-5-1-1 and VC4-5-1-2.
Example 4 ED-VC4::VC4-5-1-1:12:::TACC=4;
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Note
The command in Example 5 creates a VC48C Dual TAP on VC4-6-1-1 and VC4-6-1-25.
Example 5 ED-VC48C::VC4-6-1-1:12:::TACC=5;
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Note
ED-VC12
When an ED-VC12 is executed for a TACC a VC12 TAP is created. The specified VC12 AID is taken as the first VC12 connection, and the consecutive VC12 connection is used for as the second path for the TAP.
For example on a E1 card:
Example 6 ED-VC12::VC12-1-1-1-1-1:12:::TACC=6;
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;This creates a VC12 TAP on VC12-1-1-1-1-1 and VC12-1-1-1-2-1. These VC's cannot be used for creation of cross-connects until the TAP is deleted.
ED-VC3
When an ED-VC3 is executed for a TACC a VC3 TAP is created. The specified VC3 AID is taken as the first VC3 connection, and the consecutive VC3 connection is used for as the second path for the TAP.
For example on an E3 card:
Example 7 ED-VC3::VC3-1-1-1:12:::TACC=6;
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;This creates a VC3 TAP on VC3-1-1-1 and VC3-1-1-2. These VC's cannot be used for creation of cross-connects until the TAP is deleted.
TAP Connections
CONN-TACC-<rr>
The CONN-TACC command (CONN-TACC-<rr>) is used to make a connection between the TAP and the circuit or cross-connect under test.
CONN-TACC-(E1, E3, DS3I, VC12, VC3, VC4, VC42c, VC43c, VC44c, VC48c, VC416c, VC464c):[<TID>]:<AID>:<CTAG>::<TAP>:MD=<MD>;
Connect the port/VC4n/VC3 defined by <AID> to the port/VC4n/VC3 defined by the <TAP> number. The Mode of Test Access to the circuit/cross-connect is specified by <md>. The modes can be either of monitor (non-intrusive), Split or Loop (intrusive) modes. The various modes are described in the "Test Access Configurations" section.
Note
Note
Table 1 shows the error codes supported by the CONN-TACC-<rr> command.
Example 8 CONN-TACC-E1::FAC-1-3:12::1:MD=MONE;
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1
;This creates a connection between TAP with number 1 and the port/facility FAC-1-3 with access mode as MONE. The various modes are explained in detail in the "Test Access Mode Definitions" section.
Change Access Mode
CHG-ACCMD-<rr>
CHG-ACCMD- (E1, E3, DS3I, VC12, VC3, VC4, VC42c, VC43c, VC44c, VC48c, VC416c, VC464c):[<TID>]:<TAP>:<CTAG>::<MD>;
Change the type of test access. This may be a change from monitoring the data to inserting data into the VC. This command can only be applied to an existing TAP connection. If one does not exist a RTEN error is returned.
Table 2 shows the error codes supported by the CHG-ACCMD-<rr> command.
Table 2 Supported Error Codes for CHG-ACCMD-<rr>
SRCN
REQUESTED CONDITION ALREADY EXISTS
SRAC
REQUESTED ACCESS CONFIGURATION IS INVALID
RTEN
REQUESTED TAP DOES NOT EXIST
Example 9 CHG-ACCMD-E1::1:12::LOOPE;
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Note
Note
Note
Retrieving TAP Information
RTRV-<rr>
RTRV- (E1, E3, DS3I, VC12, VC3, VC4, VC42c, VC43c, VC44c, VC48c, VC416c, VC464c):[<TID>]:<AID>:<CTAG>;
These commands are modified to include the return of a TAP number if the requested <AID> is defined as a TAP. An optional TACC=<TAPNUMBER> will be displayed in the output list if the requested <AID> is defined as a TAP. The TAPTYPE is supported starting with R4.6.
Example 10 RTRV-E1::FAC-1-1:D;
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"FAC-1-1::LINECDE=HDB3,FMT=E1-MF,TACC=1,TAPTYPE=DUAL,SOAK=32:OOS,"
;Table 3 shows parameters for the RTRV-<rr> command.
RTRV-TACC
RTRV-TACC:[<TID>]:<TAP>:<CTAG>;
This command can also be used to retrieve details associated with a TAP. The TAP is identified by the TAP number. The ALL input TAP value means that the command will return all the configured TACCs in the NE.
Example 11 RTRV-TACC:CISCO:241:CTAG;
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"241:STS-2-1-1.STS-2-2,MONE,STS-12-1-1,STS-13-1-1"
;Table 4 shows parameters for the RTRV-TACC command.
Disconnect a TAP
DISC-TACC
DISC-TACC:[<TID>]:<TAP>:<CTAG>;
Disconnect the <TAP> and put the connection back to it's original state (no access).
Table 5 shows the error codes supported by the DISC-TACC command.
Table 5 Supported Error Codes for DISC-TACC
SADC
ALREADY DISCONNECTED
SRTN
UNABLE TO RELEASE TAP
Figure 3 DISC-TACC::1:12;
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Note
Note
3 Test Access Configurations
Figure 4 Single node view (Node 1)
ED-VC4::VC4-1-1-1:90:::TACC=1;
Changes VC4 1 & VC4 2 on slot 1 to a TAP. The CTAG is 90. Sets the TAP number to 1.
CONN-TACC-VC4::<AID for E or F depending on md>:91::1:MONE
Connects the <AID> to the TACC defined by TAP 1 on the E side. CTAG is 91
Note
Figure 5 Multi-node view (MONE example)
On NE3
ENT-CRS-VC4::<AID I-G>:100::2WAY; A connection, not a TAP. CTAG is 100.
ENT-CRS-VC4::<AID J-H>:101::2WAY; Second connection, not a TAP;
On NE1
Assuming the path from A to B is already entered. The A and B points in the diagram refer to entry and exit points on the node or different cards. The E/F designators refer to the two 2-way connections from NE3.
ED-VC4::VC4-1-1-1:D:::TACC=4; Creates TAP with VC4-1-1-1 and VC4-1-1-2 through NE1. TAP number assigned is 4.
CONN-TACC-VC4::<AID A or B>:102::4:<MD> connects TAP 4 to the circuit.
Note
Test Access Mode Definitions
The following diagrams show what the different test access modes <MD> refer to. Figure 6 shows a circuit with no access (dual FAD TAP), Figure 7 shows a circuit with no access (single FAD TAP), followed by all the modes. The QRS may be generated by an outside source, i.e. the empty connection of the BRTU.
Intrusive and Non-Intrusive Modes
MONE, MONF, and MONEF access modes are non-service effecting and can be applied to an IS (in service) port state.
LOOPE, LOOPF, SPLTE, SPLTF, SPLTEF, SPLTA, SPLTB, and SPLTAB access modes are intrusive and only be applied to a circuit/port that is in the OOS_MT (out of service, maintenance) port state. The NE will change the state of the circuit under test to OOS_MT during the period of TACC and restore it to the original state once the connection between the TAP and the circuit is dropped.
Figure 6 Circuit with no access (dual FAD TAP)
Figure 7 Circuit with no access (single FAD TAP)
MONE
Monitor E (MONE) indicates a monitor connection provided from the facility access digroup (FAD) to the A transmission path of the accessed circuit (Figure 8 and Figure 9). This is a non-intrusive mode.
Figure 8 MONE access single TAP
Figure 9 MONE access dual TAP
MONF
Monitor F (MONF) indicates that the FAD is providing a monitor connection to the B transmission path of the accessed circuit (Figure 10 and Figure 11). This is a non-intrusive mode.
Figure 10 MONF access single TAP
Figure 11 MONF access dual TAP
Note
MONEF
Monitor EF (MONEF) is a monitor connection provided from the FAD1 (odd pair) to a DFAD, to the A transmission path and from FAD2 (even pair) of the same DFAD, to the B transmission path of the accessed circuit (Figure 12). This is a non-intrusive mode.
MONEF for T3 (DS3 HCDS) indicates that the odd pair of a FAP is providing a monitor connection to the A transmission path and from the even pair of a facility access path (FAP) to the B transmission path of the accessed circuit.
Figure 12 MONEF access dual TAP
SPLTE
Split E (SPLTE) indicates to split both the A and B paths and connect the E side of the accessed circuit to the FAD (Figure 13 and Figure 14).
Figure 13 SPLTE access single TAP
Figure 14 SPLTE access dual TAP
SPLTF
Split F (SPLTF) indicates to split both the A and B paths and connect the F side of the accessed circuit to the FAD (Figure 15 and Figure 16).
Figure 15 SPLTF access single TAP
Figure 16 SPLTF access dual TAP
SPLTEF
Split EF (SPLTEF) for T1 (DS1 HCDS) indicates to split both the A and B paths, connect the E side of the accessed circuit to FAD1 and the dual facility access digroup (DFAD) pair, and connect the F side to the FAD2 of the same DFAD pair. SPLTEF for T3 (DS3 HCDS) indicates to split both the A and B paths and connect the E side of the accessed circuit to the odd pair of the FAP and the F side to the even pair of the FAP (Figure 17).
Figure 17 SPLTEF access dual TAP
LOOPE
Loop E (LOOPE) indicates to split both the A and B paths, connect the incoming line from the E direction to the outgoing line in the E direction, and connect this looped configuration to the FAD (Figure 18 and Figure 19). Loop E and F modes are basically identical to the SPLT E and F modes except that the outgoing signal is the incoming signal and not the signal from the remote test unit (RTU).
Figure 18 LOOPE access single TAP
Figure 19 LOOPE access dual TAP
LOOPF
Loop F (LOOPF) indicates to split both the A and B paths, connect the incoming line from the F direction to the outgoing line in the F direction and connect this looped configuration to the FAD (Figure 20 and Figure 21).
Figure 20 LOOPF access single TAP
Figure 21 LOOPF access dual TAP
SPLTA
Split A (SPLTA) indicates that a connection is provided from both the E and F sides of the A transmission path of the circuit under test to the FAD and split the A transmission path (Figure 22 and Figure 23). These modes are similar to the Split E and F modes, except the signals are sent to the RTU, not the NE signal configuration.
Figure 22 SPLTA access single TAP
Figure 23 SPLTA access dual TAP
SPLTB
Split B (SPLTB) indicates that a connection is provided from both the E and F sides of the B transmission path of the circuit under test to the FAD and split the B transmission path (Figure 24 and Figure 25).
Figure 24 SPLTB access single TAP
Figure 25 SPLTB access dual TAP
4 Unmapped AID TAP Connections
The Cisco ONS 15454 SDH also supports connections to unmapped AIDs (unmapped circuits). The TAPs can be connected to an unmapped AID (an AID that does not have a cross-connect on it). The access modes supported are MONE, SPLTE and LOOPE. Example 12 creates a TAP on VC4-5-1-1.
Example 12 ED-VC4::VC4-5-1-1:12:::TACC=1;
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;Example 13 creates an unmapped AID connection with a MONE access mode. VC4-5-1-3 does not have a cross-connect on it. VC4-5-1-3 becomes unusable until the connection is disconnected by the DISC-TACC command.
Example 13 CONN-TACC-VC4::VC4-5-1-3:12::1:MD=MONE;
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1
;
Notes:
1.
2.
a.
b.
5 Parameter Types
TACC_MODE
Test access mode
MOD_TACC
Test access modifier
TAPTYPE
Test access path/point type
6 Test Access Terminology
BRTU—Broadband remote test unit
DFAD—Dual facility access digroup
FAD—Facility access digroup
FAP—Facility access path
LOOPE—Split/loop access on A and B paths equipment side
LOOPF—Split/loop access on A and B paths facility side
MONE—Monitor access with signal detector on A path
MONF—Monitor access with signal detector on B path
MONEF—Monitor access with signal detector on A and B paths
QRS—Quasi-random signal (bit test pattern)
RTU—Remote test unit
SPLTA—Split access on A path with signal detector from equipment, QRS on facility side
SPLTB—Split access on B path with signal detector from equipment, QRS on equipment side
SPLTE—Split access on A and B paths with signal detector from equipment, QRS on equipment side
SPLTF—Split access on A and B paths with signal detector from equipment, QRS on facility side
SPLTEF—Split access on A and B paths for testing in both equipment and facility directions
TACC—Test access
TAP—Test access path/point
SDH—Synchronous digital hierarchy
VC-11—Virtual container level 1 type 1. An SDH lower-order path. Equivalent to a VT-1.5 in SONET.
VC-12—Virtual container level 1 type 2. An SDH lower-order path. Equivalent to a VT-2 in SONET.
VC-3—Virtual container level 3. An SDH lower-order path.
VT1—Virtual tributary 1
Path Naming Conventions:
E—Equipment test access point direction
F—Facility test access point direction
A—Transmission path (the direction of transmission on the A pair is from E to F)
B—Transmission path (the transmission direction for the B pair is from F to E)
Guest
