- About this Guide
- Chapter 1, ACT Commands
- Chapter 2, ALW Commands
- Chapter 3, APPLY Commands
- Chapter 4, CANC Commands
- Chapter 5, CHG Commands
- Chapter 6, CLR Commands
- Chapter 7, CONN Commands
- Chapter 8, COPY Commands
- Chapter 9, DISC Commands
- Chapter 10, DLT Commands
- Chapter 11, ED Commands
- Chapter 12, ENT Commands
- Chapter 13, EX Commands
- Chapter 14, INH Commands
- Chapter 15, INIT Commands
- Chapter 16, OPR Commands
- Chapter 17, REPT Commands
- Chapter 18, RLS Commands
- Chapter 19, RMV Commands
- Chapter 20, RST Commands
- Chapter 21, RTRV Commands
- Chapter 22, SCHED Commands
- Chapter 23, SET Commands
- Chapter 24, SW Commands
- Chapter 25, Access Identifiers
- Chapter 26, Conditions
- Chapter 27, Modifiers
CONN Commands
This chapter provides connect (CONN) commands for the Cisco ONS 15454, Cisco ONS 15310-MA, and Cisco ONS 15600.
7.1 CONN-TACC-<MOD_TACC>
(Cisco ONS 15454, ONS 15310-MA, ONS 15600) The Connect Test Access for DS1, DS3I, E1, E3, STS1, STS12C, STS18C, STS192C, STS24C, STS3C, STS48C, STS6C, STS9C, T1, T3, VT1, or VT2 (CONN-TACC-<MOD_TACC> command connects the synchronous transport signal (STS) or Virtual Tributary (VT) defined by the access identifier (AID) to the STS specified by the test access point (TAP) number.
See Table 27-1 for supported modifiers by platform. For more information about TACC, refer to the Cisco ONS SONET TL1 Reference Guide.
Usage Guidelines
For this command to be applicable, you must first create the TAP using the ED-<VC_PATH> or ED-VC12 command. Intrusive test access modes are traffic-affecting. If a facility/path is connected to a TAP in an intrusive test access mode, it is forced to go into the Locked-Maintenance state. The forced transition could be traffic-affecting. The present state of the facility/path is stored by the NE and is restored when the TAP connection is brought down. Test access connections are dropped automatically if the TL1 session is terminated or is timed out.
The following actions will return error messages:
•If all TAPs are busy, a RABY error message is returned.
•If a requested TAP is busy, a RTBY error message is returned.
•If a requested TAP does not exist, a RTEN error message is returned.
•If a circuit is already connected to another TAP, a SCAT error message is returned.
•If a requested condition already exists, a SRCN error message is returned.
•And invalid AID will return an Input, Invalid Access Identifier (IIAC) error message.
•If an access is not supported, an EANS error message is returned.
•If a requested access configuration is invalid, a SRAC error message is returned.
•You cannot connect a TACC to a cross-connect that is in pending roll.
•A connection can be made to a cross-connection, in which case all modes of access are supported. A connection to an Unmapped AID (an AID without a cross-connect on it) will allow only MONE, SPLTE, and LOOPE modes.
•A connection to the protect path of a 1+1, 1:1, or 1:N is not allowed; however, connecting to the PCA path of a two-fiber or four-fiber multiplex section-shared protection ring (MS-SPRing) is supported. This will be preempted when a MS-SPRing switch occurs.
•When you connect a TACC to a protect subnetwork connection protection (SNCP) trunk, you will always be connected to the working trunk instead.
Category
Troubleshooting and Test Access
Security
Maintenance
Input Format
CONN-TACC-<MOD_TACC>:[<TID>]:<SRC>:<CTAG>::<TAP>:MD=<MD>;
Input Example
CONN-TACC-STS1:CISCO:STS-2-1-4:123::8:MD=MONE;
Input Parameters
<SRC> |
Source AID from the "ALL" section. SRC must not be null. |
<TAP> |
The test access point number. The TAP number is used to identify all messages between the TSC and the NE until the access point is released. The TAP number must be an integer with a range of 1 to 999. The TAP must not be null. |
<MD> |
The test access mode. (SPLTE, SPLTF, LOOPE, and LOOPF require an external quasi-random signal [QRS] input signal.) Single facility access digroup (FAD) test access does not support MONEF, SPLTEF, and SPLTAB modes. MD must not be null. The parameter type is test access mode (TACC_MODE). |
•LOOPE |
Splits both the A and B paths. Connect the line incoming from E direction to the line outgoing in the E direction, and connect this looped configuration to the FAD. The line outgoing in the F direction will have a QRS connected, and the line incoming from the F direction will be terminated by the nominal characteristic impedance of the line. Intrusive test access mode. |
•LOOPF |
Splits both the A and B paths. Connects the line incoming from F direction to the line outgoing in the F direction, and connects this looped configuration to the FAD. The line outgoing in the E direction will have a QRS connected, and the line incoming from the E direction will be terminated by the nominal characteristic impedance of the line. Intrusive test access mode. |
•MONE |
Indicates that a monitor connection is to be provided from the FAD to the A transmission path of the accessed circuit. |
•MONEF |
Indicates that a monitor connection is to be provided from the FAD1 to a dual FAD (DFAD), or the odd pair of a facility access path (FAP), to the A transmission path, and from FAD2 of the same DFAD, or the even pair of a FAP, to the B transmission path of the accessed circuit. |
•MONF |
Indicates that a monitor connection is to be provided from the FAD to the B transmission path of the accessed circuit. |
•SPLTA |
Indicates that a connection is to be provided from both the E and F sides of the A transmission path of the circuit under test to the FAD and split the A transmission path. Intrusive test access mode. |
•SPLTB |
Indicates that a connection is to be provided from both the E and F sides of the B transmission path of the circuit under test to the FAD and split the B transmission path. Intrusive test access mode. |
•SPLTE |
Splits both the A and B paths and connects the E side of the accessed circuit to the FAD. The line outgoing in the F direction will have a QRS connected, the line incoming from the F direction will have a QRS connected, and the line incoming from the E direction will be terminated by the nominal characteristic impedance of the line. Intrusive test access mode. |
•SPLTEF |
Splits both the A and B paths, and connects the E side of the accessed circuit to FAD1 and the F side to FAD2. Intrusive test access mode. |
•SPLTF |
Splits both the A and B paths and connects the F side of the accessed circuit to the FAD. The line outgoing in the E direction will have a QRS connected, and the line incoming in the E direction will have a QRS connected. The line incoming from the E direction will be terminated by the nominal characteristic impedance of the line. Intrusive test access mode. |
Output Format
SID DATE TIME
M CTAG COMPLD
"<TAP>"
;
Output Example
TID-000 1998-06-20 14:30:00
M 001 COMPLD
"8"
;
Output Parameters
<TAP> |
The test access point number. The TAP number is used to identify all messages between TSC and NE until the access point is released. The TAP number must be an integer with a range of 1 to 999. |